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Electron Microscopy


High Resolution Transmission Electron Microscope HRTEM Jeol ARM 200F

Specification:

  •     Maximum accelerating voltage: 200 kV
  •     Maximum resolution: 0.63 Å
  •     STEM
  •     Detectors: Bright, Dark Field Detector, High-Angle Annular Dark Field Detector
  •     Spectroscopy: Energy Dispersive X-Ray Spectroscopy (EDS), Electron Energy-Loss, Spectroscopy (EELS), Gatan Imaging Filter


Applications:

  •     High resolution microscopy of nanostructures (nanotubes, nanospheres)
  •     High resolution microscopy of semiconductors
  •     Elemental analysis
  •     Electron diffraction
 

Transmission Electron Microscope Jeol 1400

Specification:

  • Maximum accelerating voltage: 120 kV

  • Maximum resolution: 0.2 nm

  • Holder for  cryoTEM 

Applications:

  • Imaging of nanosystems

  • Studies of soft matter (polymers, colloids) and biological systems

  • Electron tomography and 3D imaging


Scanning Electron Microscope SEM Jeol 7001TTLS

Specification:

  •     Maximum accelerating voltage: 30 kV
  •     Maximum resolution: 1.5 nm
  •     cryoSEM
  •     Spectroscopy: Energy Dispersive X-Ray Spectroscopy (EDS)
  •     Electron beam lithography

Applications:

  •     Imaging of nanosystems
  •     Studies of soft matter (polymers, colloids) and biological systems
  •     Studies of porous systems
 

Focused Ion Beam – FIB

Specification:

  • Ion source: Ga liquid metal ion source

  • Maximum resolution of image: 5 nm

  • Maximum current beam: 60 nA at 30 kV

Applications:

  • Sample preparation for TEM and SEM

  • Litography


Equipement for sample preparation

  • Critical point dryer
  • CryoPlunge for deep and rapid freezing
  • Ultramicrotome (cryo option)
  • High vacuum coating system
 

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