X-ray laboratory
X-ray diffraction (XRD)
X-ray diffractometer EMPYREAN (PANalytical) and accessories
Two-wheel powder diffractometer operating in Bragg-Brentano geometry. Standard equipment includes a Cu X-ray tube with linear/point focus (Co and Ag tubes are also available), a rotating transmission/reflection table and a PIXcel 3D high-speed linear detector operating in four modes. In addition, EMPYREAN has an unusually wide range of optional equipment, including a solid sample stage, a TTK 450 temperature stage, a rotary capillary stage, a CT stage, an additional scintillation detector and two independent cooling systems, i) Oxford Cryosystems (Cryostream 700 series, Plus), ii) Anton Paar (TCU 110), operating in the ranges -193°C to +227°C and -193°C to +450°C respectively.
The extensive configuration of the instrument in the PreFIX system (pre-aligned fast interchangeable X-ray modules) allows different types of measurements to be carried out, i.e.
- quantitative and qualitative phase analysis (based on the latest ICDD database PDF4+ - updated annually),
- phase analysis as a function of temperature,
- phase analysis of a substance using capillaries,
- analysis of the distribution of distances between pairs of particles contained in a given volume - PDF (Pair Distribution Function),
- fixed-angle geometry (SKP) measurements,
- average size and pore/grain size distribution measurements using the SAXS (Small Angle X-ray Scattering) method.
X'Pert PRO MRD X-ray diffractometer (PANalytical) and accessories
Four-wheel diffractometer, mainly dedicated to the analysis of thin films. Standard equipment includes a Cu x-ray tube with linear/point focus, magnetic stage, two proportional detectors (Xe) and a slit kit.In addition, we have as accessories: a parabolic Cu mirror (MRD), a 4xGe200 monochromator, a 0.18° parallel collimator, high-resolution deflected beam optics (Triple axis arm and Rocking Curve arm ), a programmable primary beam absorber (attenuator). Research scope:- thin film thickness and morphology analysis (reflectometry),
- thin film stress and texture analysis,
- low angle surface diffraction
- inverse-space mapping