Electron Microscopy
HRTEM Jeol ARM 200F transmission electron microscope
Basic technical parameters
- Maximum acceleration voltage: 200 kV
- Maximum resolution: 0.63 Å
- Mode observation capabilities: TEM and STEM
- Detectors: Bright, dark field, high angle annular dark field
- Spectroscopy: Energy dispersive X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS)
Scope of research
- Imaging of nanostructures (nanotubes, nanospheres)
- Imaging of semiconductor materials
- Chemical composition analysis
- Electron diffraction
Transmission electron microscope 120kV
Basic technical parameters
- Maximum acceleration voltage: 120 kV
- Maximum resolution: 0.2 nm
- CryoTEM (liquid nitrogen temperature) stage.
Scope of research
- Imaging of nanostructures (nanotubes, nanospheres)
- Imaging of soft matter (polymers, colloids) in cryoTEM mode and biological systems
- Three-dimensional imaging
- Tomography TEM
Scanning electron microscope (SEM) Jeol 7001TTLS
Basic technical parameters
- Maximum acceleration voltage: 30 kV
- Maximum resolution: 1.5 nm
- Accessory kit for cryoSEM (at liquid nitrogen temperature)
- Spectroscopy: Energy dispersive X-ray spectroscopy (EDS)
- Electron lithography kit
Scope of research
- Imaging of nanostructures (nanotubes, nanospheres, etc.)
- Imaging of porous systems
- Imaging of soft matter and biological systems
List of equipment used for sample preparation
- Critical point dryers
- Sample vitrification unit (CryoPlunge)
- Ultramicrotome (with cryo option)
- Vacuum sputtering unit
- Ultramicrotome