Available modes: Contact Mode (air), Tapping Mode (air), PhaseImaging, Lift Mode, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Dark Lift, Lateral Force, Microscopy, Nano-Indentation, Scanning Tunneling Microscopy STM, Low Current STM, Conductive AFM, STM with EC, Contact and Tapping Modes with EC, Surface Potential, Piezoresponse, Scanning Capacitance, Force Modulation.