Dr. Mariusz Jancelewicz
Degree:
Ph.D. in Physics, Adam Mickiewicz University in Poznan, Poland, 2008
+48 61 829 6711
marjan7@amu.edu.pl
Research interests:
- Transmission and scanning electron microscopy
- Fabrication of 2D atomic-thick layered structures
- Silicon-based organic polymeric systems
- Molecular dynamics and structure of the polymers in the molten state
- NMR spectroscopy and rheology
Selected publications:
- J. Idígoras, J. Sobuś, M. Jancelewicz, E. Azaceta, R. Tena-Zaera, J. A. Anta, M. Ziółek, Effect of different photoanode nanostructures on the initial charge separation and electron, Materials Chemistry and Physics, 2016, DOI: 10.1016/j.matchemphys.2015.12.042
- I. Iatsunskyi, M. Jancelewicz, G. Nowaczyk, M. Kempiński, B. Peplińska, M. Jarek, K. Załęski, S. Jurga, V. Smyntyna, Atomic layer deposition TiO2 coated porous silicon surface: Structural characterization and morphological features, Thin Solid Films 589 (2015) 303–308
- I. Iatsunskyi, M. Kempiński, M. Jancelewicz, K. Załęski, S. Jurga, V. Smyntyna, Structural and XPS characterization of ALD Al2O3 coated porous silicon, Vacuum 2015, 113, 52-58
- I. Iatsunskyi, M. Pavlenko, R. Viter, M. Jancelewicz, G. Nowaczyk, I. Baleviciute, K. Załęski, S. Jurga, A. Ramanavicius, V. Smyntyna, Tailoring the Structural, Optical, and Photoluminescence Properties of Porous Silicon/TiO2 Nanostructures, J. Phys. Chem. C, Article ASAP 2015, DOI: 10.1021/acs.jpcc.5b01670
- I. Iatsunskyi, M. Kempinski, G. Nowaczyk, M. Jancelewicz, M. Pavlenko, K. Załeski, Stefan Jurga, Structural and XPS studies of PSi/TiO2 nanocomposites prepared by ALD and Ag-assisted chemical etching, Applied Surface Science 2015, 347, 777–783
- I. Iatsunskyi, E. Coy, R. Viter, G. Nowaczyk, M. Jancelewicz, I. Baleviciute, K. Załęski, S. Jurga, Study on Structural, Mechanical, and Optical Properties of Al2O3–TiO2 Nanolaminates Prepared by Atomic Layer Deposition, J. Phys. Chem. C, 2015, 119 (35), pp 20591–20599, DOI: 10.1021/acs.jpcc.5b06745
